Mr. Walid A. Tawfic Profile

Walid A. Tawfic

IC Design Consultant at Siemens EDA

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Author

Publications (3)

Proceedings Article | 31 October 2007 Paper

Safe interpolation distance for VT5 resist model

Walid Tawfic, Mohamed Al-Imam, George Bailey

Proceedings Volume 6730, 673054 (2007) https://doi.org/10.1117/12.746613

KEYWORDS: Process modeling, Data modeling, Calibration, Image processing, Optical proximity correction, Lithography, Semiconducting wafers, Geometrical optics, Printing, Integrated circuits

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Proceedings Article | 30 October 2007 Paper

Optimization of OPC runtime using efficient optical simulation

Mohamed Al-Imam, Walid Tawfic

Proceedings Volume 6730, 67302T (2007) https://doi.org/10.1117/12.746608

KEYWORDS: Computer simulations, Optical simulations, Optical proximity correction, Resolution enhancement technologies, Printing, Photomasks, Semiconducting wafers, Control systems, Visualization, Model-based design

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Proceedings Article | 28 March 2007 Paper

Feedback flow to improve model-based OPC calibration test patterns

Walid Tawfic, Mohamed Al-Imam, Karim Madkour, Rami Fathy, Ir Kusnadi, George Bailey

Proceedings Volume 6521, 65211J (2007) https://doi.org/10.1117/12.712843

KEYWORDS: Calibration, Data modeling, Image processing, Process modeling, Scanning electron microscopy, Optical proximity correction, Photoresist processing, Feature extraction, Optical lithography, Printing

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