Moojoon Shin
OPC engineer at Samsung Electronics Co. Ltd.
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 28 April 2023 Paper
Proceedings Volume 12495, 124951S (2023) https://doi.org/10.1117/12.2658321
KEYWORDS: Optical proximity correction, Machine learning, Artificial neural networks

SPIE Journal Paper | 18 November 2016
Moojoon Shin, Jee-Hyong Lee
JM3, Vol. 15, Issue 04, 043507, (November 2016) https://doi.org/10.1117/12.10.1117/1.JMM.15.4.043507
KEYWORDS: Convolutional neural networks, Lithography, Inspection, Neural networks, Machine learning, Convolution, Feature extraction, Data modeling, Semiconductors, Calibration

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