New Approach To Automated Optical/Digital Pattern Recognition

R. D. Leighty; G. E. Lukes

doi:10.1117/12.957484

10 August 1979 New Approach To Automated Optical/Digital Pattern Recognition

R. D. Leighty, G. E. Lukes

Proceedings Volume 0185, Optical Processing Systems; (1979) https://doi.org/10.1117/12.957484
Event: 1979 Huntsville Technical Symposium, 1979, Huntsville, United States

Abstract

Optical power spectral (OPS) analysis has demonstrated significant advantages for rapidly classifying simple patterns from aerial transparencies. However, as the pattern sets become larger and more complicated, the required software is more complex, the equipment requirements more demanding, and the processing time increases. Additionally, potential ambiguity of the OPS data due to loss of phase information places some unknown upper limit on the information content in OPS. Integration of other pattern recognition data which supplements the OPS analysis leads to an increased pattern classification potential. The optical/ digital system discussed integrates a photo diode array detector in the image domain with the OPS system. Hierarchical strategies employ initial OPS sampling and preliminary classification of patterns of potential interest. Space domain sampling and classification is only initiated when cued from the OPS samples. This system leads to a wide range of exper-imental capabilities and operational potentials. The paper discusses system configuration, experimental results, and future plans.

Citation Download Citation

R. D. Leighty and G. E. Lukes "New Approach To Automated Optical/Digital Pattern Recognition", Proc. SPIE 0185, Optical Processing Systems, (10 August 1979); https://doi.org/10.1117/12.957484

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Optical pattern recognition

Image processing

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