Laser Spatial Profile Measurement Device

William R. Mallory; Francis X. Jeskie; W. Lee Blanton

doi:10.1117/12.957965

15 November 1979 Laser Spatial Profile Measurement Device

William R. Mallory, Francis X. Jeskie, W. Lee Blanton

Proceedings Volume 0196, Measurements of Optical Radiations; (1979) https://doi.org/10.1117/12.957965
Event: 23rd Annual Technical Symposium, 1979, San Diego, United States

Abstract

A device is described which measures the spatial profile of a laser in either the near field or far field. The laser pattern is imaged onto a pyroelectric vidicon (PEV) camera. A single frame is extracted from the camera and the image is processed using a PDP 11/20 to correct for PEV imperfections. The device will measure lasers having wavelengths of 2 µm to 10.6 µm. Detailed characteristics of the device are given.

Citation Download Citation

William R. Mallory, Francis X. Jeskie, and W. Lee Blanton "Laser Spatial Profile Measurement Device", Proc. SPIE 0196, Measurements of Optical Radiations, (15 November 1979); https://doi.org/10.1117/12.957965

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