Paper
15 November 1979 On The Possibility Of An Absolute Radiometric Standard Based On The Quantum Efficiency Of A Silicon Photodiode
Jon Geist
Author Affiliations +
Abstract
The physical mechanisms governing the behavior of silicon photovoltaic p-n junctions are reviewed from the point of view of using the internal quantum efficiency of such devices as absolute radiometric standards.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jon Geist "On The Possibility Of An Absolute Radiometric Standard Based On The Quantum Efficiency Of A Silicon Photodiode", Proc. SPIE 0196, Measurements of Optical Radiations, (15 November 1979); https://doi.org/10.1117/12.957958
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Absorption

Silicon

Diodes

Electrons

Quantum efficiency

Reflectivity

Internal quantum efficiency

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