Morphology And Correlation With Defects Of Small Scale Laser-Induced Damage

T. A. Wiggins

doi:10.1117/12.933791

15 September 1982 Morphology And Correlation With Defects Of Small Scale Laser-Induced Damage

T. A. Wiggins

Proceedings Volume 0346, Thin Film Technologies and Special Applications; (1982) https://doi.org/10.1117/12.933791
Event: 1982 Technical Symposium East, 1982, Arlington, United States

Abstract

A method for compact storage of the appearance of films and surfaces is presented which allows comparisons prior to and following coating and laser damage testing. Observation of substrates coated with ZnS and ThF₄ films indicates that for silica substrates the predominate failure mode is cracking and delamination, while for silicon substrates, burns, cracks, and bubble-formation is found. Scratches and dust appear to act as initiators of damage. For the coated silicon substrates, over 90% of the small-scale damage sites were found to have an observable defect (>5 μm) prior to damage testing. Elimination of scratches, voids, dust, film stress, and film defects would substantially increase the damage threshold for large spot cw-radiation applications. There also appears to be 1 μm or small sized defects which would then determine the damage threshold.

Citation Download Citation

T. A. Wiggins "Morphology And Correlation With Defects Of Small Scale Laser-Induced Damage", Proc. SPIE 0346, Thin Film Technologies and Special Applications, (15 September 1982); https://doi.org/10.1117/12.933791

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