High Frequency Wavelength Modulation Spectroscopy With Diode Lasers For Optical Memory Applications

P. Pokrowsky; W. Zapka; F. Chu; G. C. Bjorklund

doi:10.1117/12.935178

30 November 1983 High Frequency Wavelength Modulation Spectroscopy With Diode Lasers For Optical Memory Applications

P. Pokrowsky, W. Zapka, F. Chu, G. C. Bjorklund

Proceedings Volume 0395, Advanced Infrared Sensor Technology; (1983) https://doi.org/10.1117/12.935178
Event: 1983 International Technical Conference/Europe, 1983, Geneva, Switzerland

Abstract

High frequency wavelength modulation spectroscopy with diode lasers is accomplished by dithering the drive current at RF frequencies between 10 and 250 MHz. This technique is useful for fast and sensitive detection of absorption lines and is applied for fast reading of information from a frequency domain optical memory based upon photochemical hole burning.

Citation Download Citation

P. Pokrowsky, W. Zapka, F. Chu, and G. C. Bjorklund "High Frequency Wavelength Modulation Spectroscopy With Diode Lasers For Optical Memory Applications", Proc. SPIE 0395, Advanced Infrared Sensor Technology, (30 November 1983); https://doi.org/10.1117/12.935178

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available