Paper
30 November 1983 Qualification Test Results Of Pigtailed PπPN APD's
D. Dumas, M. Marchand, C. Ruineau, J. Quevrin
Author Affiliations +
Proceedings Volume 0395, Advanced Infrared Sensor Technology; (1983) https://doi.org/10.1117/12.935177
Event: 1983 International Technical Conference/Europe, 1983, Geneva, Switzerland
Abstract
Silicon PπPN avalanche photodiodes with fiber pigtails (type CG 5705 FB2) have been submitted to qualification testing in order to evaluate simultaneously the performance of the crystal and the optical output fiber under extreme environmental and operational conditions. Electrical and optical results obtained demonstrate excellent performance of the photodetectors during the qualification testing and prove their suitability for telecommunication equipment.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Dumas, M. Marchand, C. Ruineau, and J. Quevrin "Qualification Test Results Of Pigtailed PπPN APD's", Proc. SPIE 0395, Advanced Infrared Sensor Technology, (30 November 1983); https://doi.org/10.1117/12.935177
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KEYWORDS
Avalanche photodetectors

Optical testing

Resistance

Silicon

Doping

Humidity

Temperature metrology

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