Paper
23 May 1984 Short Wavelength Generation Using Excimer Lasers
H Pummer, H Egger, T S. Luk, C K Rhodes
Author Affiliations +
Proceedings Volume 0461, New Lasers for Analytical & Industrial Chemistry; (1984) https://doi.org/10.1117/12.941073
Event: 1984 Los Angeles Technical Symposium, 1984, Los Angeles, United States
Abstract
High spectral brightness KrF* (249 nm) and ArF* (193 nm) excimer laser sources have been used in a variety of experiments to test the generation of coherent short wavelength radiation (λ ti 100 nm) using nonlinear processes. These experiments include harmonic generation, sum frequency mixing, two and four photon pumping of lasers as well as spectroscopic application of such short wavelength radiation and the study of nonlinear coupling at intensities of up to ≈ 1017 W/cm2.
© (1984) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
H Pummer, H Egger, T S. Luk, and C K Rhodes "Short Wavelength Generation Using Excimer Lasers", Proc. SPIE 0461, New Lasers for Analytical & Industrial Chemistry, (23 May 1984); https://doi.org/10.1117/12.941073
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KEYWORDS
Extreme ultraviolet

Ions

Excimer lasers

Chemistry

Krypton

Absorption

Xenon

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