Paper
14 May 1984 Edge Location Accuracy
J S Wiejak
Author Affiliations +
Proceedings Volume 0467, Image Assessment: Infrared and Visible; (1984) https://doi.org/10.1117/12.941610
Event: Image Assessment Infrared and Visible, 1983, Oxford, United Kingdom
Abstract
An analysis is presented of noise and resolution limitations of a typical visible light imaging system in producing a digital image, and effects of the convolution of the image with the Marr-Hildreth edge operator, and the zero-crossing interpolation scheme, on the accuracy of edge location.
© (1984) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J S Wiejak "Edge Location Accuracy", Proc. SPIE 0467, Image Assessment: Infrared and Visible, (14 May 1984); https://doi.org/10.1117/12.941610
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Interference (communication)

Electrons

Imaging systems

Silicon

Convolution

Quantization

CCD cameras

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