Relation Between Some Process Parameters And Properties Of Transition Metal-Rare Earth Films For Magneto-Optic Recording

F. E. Luborsky; J. T. Furey; R. E. Skoda; B. C. Wagner

doi:10.1117/12.946432

12 April 1985 Relation Between Some Process Parameters And Properties Of Transition Metal-Rare Earth Films For Magneto-Optic Recording

F. E. Luborsky, J. T. Furey, R. E. Skoda, B. C. Wagner

Author Affiliations +

Proceedings Volume 0529, Optical Mass Data Storage I; (1985) https://doi.org/10.1117/12.946432
Event: 1985 Los Angeles Technical Symposium, 1985, Los Angeles, United States

Abstract

Various relations are presented between a number of process variables and the resultant properties of transition metal-rare earth films. In particular the bias voltage, target voltage and argon gas pressure are related to the film coercivity, compensation temperature, anisotropy and film thickness. The domain size obtained on writing in these films with a laser is given as a function of write field, anisotropy, coercivity, film thick-ness, bias, and laser pulse width. Domains as small as 0.4 μm are reported. The trends observed are explained.

Citation Download Citation

F. E. Luborsky, J. T. Furey, R. E. Skoda, and B. C. Wagner "Relation Between Some Process Parameters And Properties Of Transition Metal-Rare Earth Films For Magneto-Optic Recording", Proc. SPIE 0529, Optical Mass Data Storage I, (12 April 1985); https://doi.org/10.1117/12.946432

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