Paper
10 December 1986 A Description Of The Focal Plane/Detector Test And Evaluation Lab At MDAC-HB
D. D. Beebe, J. J. Lowe, C. Sheldon, E. S. D'Ippolito, A. G. Osler, W. F. Morgan
Author Affiliations +
Abstract
A description of a test facility for testing and evaluating visible and infrared (IR) focal plane arrays (FPA's) and associated components and subsystems is given. The facility is comprised of three computer controlled test systems for characterization of hybrid FPA's, detector arrays, and readout electronics under cryogenic conditions. Facility capabilities include FPA assembly and dewar test and assembly.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. D. Beebe, J. J. Lowe, C. Sheldon, E. S. D'Ippolito, A. G. Osler, and W. F. Morgan "A Description Of The Focal Plane/Detector Test And Evaluation Lab At MDAC-HB", Proc. SPIE 0685, Infrared Technology XII, (10 December 1986); https://doi.org/10.1117/12.936499
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KEYWORDS
Sensors

Computing systems

Staring arrays

Detector arrays

Visible radiation

Cryogenics

Data acquisition

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