Paper
2 February 1988 Electrical Sampling Techniques
Sedki M. Riad
Author Affiliations +
Proceedings Volume 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits; (1988) https://doi.org/10.1117/12.940967
Event: Advances in Semiconductors and Semiconductor Structures, 1987, Bay Point, FL, United States
Abstract
This is a tutorial paper about electrical sampling techniques. The paper reviews the basic sampling principles. It identifies the main sampling models, analyzes them, and discusses their corresponding signal recovery requirements and methods. The paper also presents the practical aspects of sampling. The conventional diode sampling gate circuit is presented and analyzed, and typical sampling system schematics are shown and discussed.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sedki M. Riad "Electrical Sampling Techniques", Proc. SPIE 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits, (2 February 1988); https://doi.org/10.1117/12.940967
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Diodes

Capacitors

Integrated modeling

Integrated circuits

Error analysis

Oscilloscopes

Semiconductors

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