The outstanding advantage of holographic interferometry as a contact-free measuring procedure is that it enables very wide-ranging statements to be made on the behaviour of a component. Measurements are taken simultaneously at several points on the surface of the object, and the result can be assessed visually. For a more precise quantitative analysis, or for automatic evaluation in serial testing, however, evaluation by computer is indispensable. The theoretical basis for this was laid in part several years ago, and suitable equipment in a variety of standard forms has in fact been available on the market for a number of years. This contribution attemps to provide an overall view of the various principles by which holographic interferograms can nowadays be evaluated, together with the areas in which each can best be applied.
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