Measurements of the dielectric properties of explosives and inert materials at millimeter wave frequencies (V-band and above) using free space reflection methods

Peter R. Smith; James C. Weatherall; Jeffrey Barber; Kevin Yam; Joseph Greca; Barry T. Smith

doi:10.1117/12.2267195

11 May 2017 Measurements of the dielectric properties of explosives and inert materials at millimeter wave frequencies (V-band and above) using free space reflection methods

Peter R. Smith, James C. Weatherall, Jeffrey Barber, Kevin Yam, Joseph Greca, Barry T. Smith

Author Affiliations +

Proceedings Volume 10189, Passive and Active Millimeter-Wave Imaging XX; 1018908 (2017) https://doi.org/10.1117/12.2267195
Event: SPIE Defense + Security, 2017, Anaheim, CA, United States

Abstract

We present a free space material measurement system operating in the E band (60-90 GHz) frequency range that uses calibration standards placed at the sample location to define the measurement reference plane directly at the sample surface. Measurement signal to noise is improved by using an aperture in radar absorbing material (RAM) to simplify the RF measurement environment. Measurements are provided that extend earlier work done in the 18-40 GHz frequency range. Data is extracted using numerical fitting of reflection-only data to a theoretical model based on geometric optics. System calibration, and results are presented.

Citation Download Citation

Peter R. Smith, James C. Weatherall, Jeffrey Barber, Kevin Yam, Joseph Greca, and Barry T. Smith "Measurements of the dielectric properties of explosives and inert materials at millimeter wave frequencies (V-band and above) using free space reflection methods", Proc. SPIE 10189, Passive and Active Millimeter-Wave Imaging XX, 1018908 (11 May 2017); https://doi.org/10.1117/12.2267195

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