BTDF of ZnSe and BRDF of Ge with multilayer coatings at 3.39 microns

Michael M. Yang; Lawrence M. Scherr; Karen J. Sorensen

doi:10.1117/12.58696

1 January 1992 BTDF of ZnSe and BRDF of Ge with multilayer coatings at 3.39 microns

Michael M. Yang, Lawrence M. Scherr, Karen J. Sorensen

Proceedings Volume 10261, Infrared Thin Films: A Critical Review; 102610C (1992) https://doi.org/10.1117/12.58696
Event: Critical Reviews, 1991, San Jose, CA, United States

Abstract

BTDF at 3.39 microns was measured on ZnSe substrates and on substrates with 1/2, 2/3, and full multilayer coatings. BRDF at 3.39 microns was also measured on Ge substrates with multilayer coatings. The BTDF and BRDF range for coated samples overlaps the range for the uncoated substrates.

Citation Download Citation

Michael M. Yang, Lawrence M. Scherr, and Karen J. Sorensen "BTDF of ZnSe and BRDF of Ge with multilayer coatings at 3.39 microns", Proc. SPIE 10261, Infrared Thin Films: A Critical Review, 102610C (1 January 1992); https://doi.org/10.1117/12.58696

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