Paper
1 June 1993 Applications of interferometry and automated inspection in Japan
Author Affiliations +
Proceedings Volume 10268, Optical Inspection and Testing: A Critical Review; 102680F (1993) https://doi.org/10.1117/12.170175
Event: Applications in Optical Science and Engineering, 1992, Boston, MA, United States
Abstract
Recent developments of interferometric techniques for industrial inspection in Japan are reviewed, with special emphasis on automatic fringe analysis, use of unique interferometers, use of advanced devices.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Toyohiko Yatagai "Applications of interferometry and automated inspection in Japan", Proc. SPIE 10268, Optical Inspection and Testing: A Critical Review, 102680F (1 June 1993); https://doi.org/10.1117/12.170175
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KEYWORDS
Inspection

Interferometry

Fringe analysis

Interferometers

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