Paper
7 June 1989 Dynamic Measurements Of A Simplified Streak Device
A. V. Babushkin, E. Jaeger, V. E. Postovalov, C. Rempel, M. Ya. Schelev
Author Affiliations +
Proceedings Volume 1032, 18th Intl Congress on High Speed Photography and Photonics; (1989) https://doi.org/10.1117/12.969078
Event: 18th International Congress on High Speed Photography and Photonics, 1988, Xi'an, Shaanxi, China
Abstract
Described are the comparative testing of two type of electron-optical recording instruments, namely, TDS simplified streak device designed and manufactured at the Centre of Scientific Instruments, GDR Academy of Sciences, and anglo-soviet Imacon 500 picosecond streak camera fitted with PV-001 tube. The Imacon 500 streak camera was matched with a SIT vidicon readout system. Temporal resolution, dynamic range and input sensitivity were estimated for the same recording conditions. It was shown that for 6 ps laser probe pulses the TDS dynamic sensitivity at 530 nm input radiation is only four times less comparative to the commercial Imacon 500 system, while both systems have almost the same dynamic range.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. V. Babushkin, E. Jaeger, V. E. Postovalov, C. Rempel, and M. Ya. Schelev "Dynamic Measurements Of A Simplified Streak Device", Proc. SPIE 1032, 18th Intl Congress on High Speed Photography and Photonics, (7 June 1989); https://doi.org/10.1117/12.969078
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KEYWORDS
Picosecond phenomena

Imaging systems

Silicon

Diodes

Streak cameras

Temporal resolution

Cameras

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