Manifestations Of Through Thickness Thermal Gradients In Laser Irradiated Thin Films

Brian J. Bartholomeusz

doi:10.1117/12.952759

19 May 1989 Manifestations Of Through Thickness Thermal Gradients In Laser Irradiated Thin Films

Brian J. Bartholomeusz

Proceedings Volume 1078, Optical Data Storage Topical Meeting; (1989) https://doi.org/10.1117/12.952759
Event: OE/LASE '89, 1989, Los Angeles, CA, United States

Abstract

Low conductivity, laser-irradiated thin films such as the chalcogenides employed for optical data storage can display manifestations of signific ant through-thickness thermal gradients. A combined Laplace-transform, Fourier-integral method was utilized to derive the temperature distributions in laser-irradiated, low conductivity thin films, and the results were used to examine the effects of some marking parameters on through-thickness thermal gradients. These were found to be strongly influenced by the laser incidence direction, the coefficient of optical absorption, and the film thickness, and influe:aced to a somewhat lesser degree by the scanning velocity.

Citation Download Citation

Brian J. Bartholomeusz "Manifestations Of Through Thickness Thermal Gradients In Laser Irradiated Thin Films", Proc. SPIE 1078, Optical Data Storage Topical Meeting, (19 May 1989); https://doi.org/10.1117/12.952759

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available