An Apparatus For Measuring The Specular Reflectance Of Optical Components At Cryogenic Temperatures

John F. Gerhard; Ronald D. Bigelow

doi:10.1117/12.960738

20 September 1989 An Apparatus For Measuring The Specular Reflectance Of Optical Components At Cryogenic Temperatures

John F. Gerhard, Ronald D. Bigelow

Proceedings Volume 1110, Imaging Infrared: Scene Simulation, Modeling, and Real Image Tracking; (1989) https://doi.org/10.1117/12.960738
Event: SPIE 1989 Technical Symposium on Aerospace Sensing, 1989, Orlando, FL, United States

Abstract

A unique apparatus for measuring the specular reflectance of bare and anti-reflection coated optical components, at cryogenic temperatures, has been developed through a joint effort between the Metrology Department and the Electro-Optical Center of Rockwell International Corporation's Autonetics Electronics Systems Division, in Anaheim, California. An invention disclosure for the apparatus has been filed with Rockwell.

Citation Download Citation

John F. Gerhard and Ronald D. Bigelow "An Apparatus For Measuring The Specular Reflectance Of Optical Components At Cryogenic Temperatures", Proc. SPIE 1110, Imaging Infrared: Scene Simulation, Modeling, and Real Image Tracking, (20 September 1989); https://doi.org/10.1117/12.960738

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