Open Access Paper
16 October 2019 Front Matter: Volume 11102
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 11102, including the Title Page, Copyright information, Table of Contents, Author and Conference Committee lists.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

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Author(s), “Title of Paper,” in Applied Optical Metrology III, edited by Erik Novak, James D. Trolinger, Proceedings of SPIE Vol. 11102 (SPIE, Bellingham, WA, 2019) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510628977

ISBN: 9781510628984 (electronic)

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Agena, Brian D., 0D, 0E

Allen, Angela Davies, 0X

Allison, Kyle, 13

Amblard, Francois, 0N

Arai, Y., 03

Bartsch, Jonas, 0Q

Bergmann, Ralf B., 0Q

Berkson, Joel D., 07

Bingham, Samuel P., 0E

Buckner, Benjamin D., 0R

Cai, Zewei, 1C

Chen, Jiawei, 1C

Chen, Liang-Chia, 0A, 1K

Choi, Heejoo, 07

Choi, Samuel, 1A

Clermont, L., 04

Clifford, Christopher, 15, 16

Colicchia, Ennio, 18

Colonna de Lega, Xavier, 0G

Coupland, Jeremy, 05

Crenshaw, M. Melissa, 0V

de Groot, Peter, 0G, 0K

De la Torre Ibarra, Manuel H., 0H

Desbiens, Jacques, 0W

Dioumaev, Andrei K., 17

Domínguez, A. D., 1I

Domken, I., 04

Dong, Xingchen, 18

Du, Yubin, 1F

Escobar, Marco A., 0M

Estrada, Julio C., 0M

Faber, Christian, 0P

Feng, Guohua, 10

Fitzgerald, Danette, 0K

Flores Moreno, Jorge Mauricio, 0H, 1N

George, Jacob, 16

Getz, Lauren, 1J

Ghazala, Hamza B., 18

Gomez-Tejada, Daniel, 06

González Contreras, Francisco Javier, 1N

Gordeyev, Stanislav, 0F

Graciani, Guillaume, 0N

Graves, Logan R., 07

Guo, Qi, 0T

Hallman, Mark, 13

Han, Seongheum, 1E, 1G

Hardin, Johanna, 13

He, A., 0Y

Healy, Keith P., 0D, 0E

Hénault, François, 0C

Hernández-Montes, María del Socorro, 0H

Hudgings, Janice, 13

Hyun, Jae-Sang, 08

Jacobs, J., 04

Jain, Swati, 0X

Jenkins, Thomas, 16

Jiang, Hongzhi, 0T, 11

Jiang, Jiabin, 10

Jiang, Ming-Jun, 0A, 1K

Jumper, Eric J., 0F

Kalensky, Matthew, 0F

Kalms, Michael, 0Q

Kam, John, 07

Kickingereder, Reiner, 0P

Kienle, Patrick, 18

Kim, Dae Wook, 07

Kim, Seungman, 1E, 1G

Kim, Seung-Woo, 1E, 1G

Kim, W., 1E

Koch, Alexander W., 18

Köhler, Michael H., 18

Koskelo, EliseAnne, 13

Krause, Ben, 1J

Lal, Amit K., 17

Leach, Richard, 05, 0G

Lei, Huang, 07

L’Esperance, Drew, 0R

Li, Shaoliang, 0S

Li, Xudong, 0T, 11

Li, Yanwei, 1F

Liang, Hanning, 0P

Liang, Zijian, 09

Lindell, Kramer, 12

Liu, Bin, 1A

Liu, Mingyu, 05

Liu, Xiaoli, 1C

Lopez-Mago, D., 1D

Lu, ZiChen, 10

Luis, Daniel, 1N

Mainaud-Durand, H., 0L

Malacara Hernández, Daniel, 06

Marcotte, S., 04

Marquet, B., 04

Martínez, A., 1I

Mazy, E., 04

Méndez-Lozoya, Javier, 1N

Mendoza Santoyo, Fernando, 0H, 1N

Michel, C., 04

Miura, Kenjiro T., 1L

Nguyen, Q.-K., 1E

Niu, Zhenqi, 0S

Novak, Erik, 12

Oh, Jeong-Seok, 1E, 1G

Osten, Wolfgang, 1C

Palacios-Ortega, Natalith, 0H

Pannetier, Cyril, 0C

Patra, Shekhar Kumar, 0Q

Pedrini, Giancarlo, 1C

Peng, Siping, 0S

Peng, Xiang, 1C

Plascencia, Germán, 0H

Prasai, Chris, 1J

Quan, C., 0Y

Radosevich, Cameron, 0E

Radunskaya, Ami, 13

Rayas, J. A., 1I

Reichelt, Stephan, 0B

Rivera-Ortega, U., 1D

Ro, Seung-Kook, 1E, 1G

Rude, V., 0L

Rutkowski, J., 0L

Schardt, Michael, 18

Shibata, G., 1L

Sosin, M., 0L

Stockman, Y., 04

Su, Rong, 05, 0G

Suzuki, Takamasa, 1A

Tayag, Tristan J., 1J

Thomas, Matthew, 05

Thurow, Brian, 15, 16

Trolinger, James D., 17

Tuffli, Andrea L., 0D, 0E

Usuki, S., 1L

Valdevit, Lorenzo, 17

Vargas, Javier, 0M

Wang, Kun, 18

Wells, Jonathon, 0F

Wheeler, Jared, 12

Wilcox, Christopher C., 0D, 0E

Wu, Fan, 1F

Wu, Guo-Wei, 0A, 1K

Wu, Ruotong, 0T

Xiao, Xiang, 10

Xu, Xueyang, 0S

Xue, Mowen, 11

Yang, Yongying, 09, 10, 1F

Yoshikawa, Hiroshi, 0U

Zhang, Bin, 0X

Zhang, Pengfei, 1F

Zhang, Rui, 09

Zhang, Song, 08

Zhang, Xiangchao, 0S

Zhang, Yunfei, 17

Zhao, Huijie, 0T, 11

Zimmermann, Alexander, 0P

Conference Committee

Program Track Chair

  • H. Philip Stahl, NASA Marshall Space Flight Center (United States)

Conference Chairs

  • Erik Novak, 4D Technology Corporation (United States)

  • James D. Trolinger, MetroLaser, Inc. (United States)

Conference Program Committee

  • Anand Krishna Asundi, Nanyang Technological University (Singapore)

  • Angela Davies, The University of North Carolina at Charlotte (United States)

  • Peter J. de Groot, Zygo Corporation (United States)

  • Jacob George, MetroLaser, Inc. (United States)

  • Khaled J. Habib, Kuwait Institute for Scientific Research (Kuwait)

  • Sen Han, University of Shanghai for Science and Technology (China)

  • Kevin G. Harding, Optical Metrology Solutions (United States)

  • Pengda Hong, Lehigh University (United States)

  • Richard K. Leach, The University of Nottingham (United Kingdom)

  • Kate Medicus, Ruda-Cardinal, Inc. (United States)

  • Levent Onural, Bilkent University (Turkey)

  • Peter Roos, Bridger Photonics, Inc. (United States)

  • Christopher C. Wilcox, Air Force Research Laboratory (United States)

  • Toru Yoshizawa, Tokyo University of Agriculture and Technology (Japan)

Session Chairs

  • 1 Surface Metrology I

    James Davis Trolinger, MetroLaser, Inc. (United States)

  • 2 Surface Metrology II

    Erik Novak, 4D Technology Corporation (United States)

  • 3 Aero Optics and Wavefront Sensing

    Christopher C. Wilcox, Air Force Research Laboratory (United States)

  • 4 Interferometry I

    James C. Wyant, James C. Wyant College of Optical Sciences, The University of Arizona (United States)

  • 5 Interferometry II

    Peter J. de Groot, Zygo Corporation (United States)

  • 6 Deflectometry and Schlieren

    Joanna Schmit, 4D Technology Corporation (United States)

  • 7 Holography and Image Evaluation

    Mary Melissa Crenshaw, Holography Consultant (Canada)

  • 8 Industrial Metrology

    Kevin G. Harding, Optical Metrology Solutions (United States)

  • 9 Plenoptic and Structured Imaging

    Jacob George, MetroLaser, Inc. (United States)

  • 10 Spectroscopy

    Danette Fitzgerald, Zygo Corporation (United States)

© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 11102", Proc. SPIE 11102, Applied Optical Metrology III, 1110201 (16 October 2019); https://doi.org/10.1117/12.2551001
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KEYWORDS
Imaging systems

3D metrology

Interferometry

3D image enhancement

3D image processing

Imaging spectroscopy

Metrology

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