Paper
2 March 2020 Machine-learning-assisted design of depth-graded multilayer x-ray structure
Thaer M. Dieb, Masashi Ishii
Author Affiliations +
Abstract
Depth-graded multilayer structures are widely used in X-ray related applications. In this paper, we propose an optimization approach using machine learning principles to accelerate depth-graded multilayer structures design. We use Monte Carlo tree search (MCTS) to find optimal thickness for each layer in the structure that achieves maximum mean reflectivity in an angular range at a specific beam energy. We obtained 0.78 mean reflectivity in an angular range 0.4~0.55° for Cu Kα radiation using this approach. For a at top structure, we could achieve a small standard deviation of 0.016 within the same range. MCTS is an iterative design method that employs tree search with guided randomization that showed exceptional performance in computer games. MCTS expands towards the promising areas of the search space making it able to search large spaces efficiently and systematically. This approach offers flexibility for multiple design purposes without the need to data availability in advance.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thaer M. Dieb and Masashi Ishii "Machine-learning-assisted design of depth-graded multilayer x-ray structure", Proc. SPIE 11287, Photonic Instrumentation Engineering VII, 112870C (2 March 2020); https://doi.org/10.1117/12.2544507
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Cited by 1 scholarly publication.
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KEYWORDS
Reflectivity

Monte Carlo methods

X-rays

Structural design

Machine learning

Materials science

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