High-resolution single-shot refractive index variation measurement using quadriwave lateral shearing interferometry (Conference Presentation)

Antoine Federici; Sherazade Aknoun; William Boucher; Benoit Wattellier

doi:10.1117/12.2544303

10 March 2020 High-resolution single-shot refractive index variation measurement using quadriwave lateral shearing interferometry (Conference Presentation)

Antoine Federici, Sherazade Aknoun, William Boucher, Benoit Wattellier

Author Affiliations +

Proceedings Volume 11290, High Contrast Metastructures IX; 112901J (2020) https://doi.org/10.1117/12.2544303
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

Quadriwave lateral shearing interferometry (QWLSI) is a wave front sensing technology based on the analysis of an interferogram created by waves diffracted by an optical grating set in front of a camera sensor. Since QWLSI is a single-arm interferometry modality is has the advantage of being very compact, robust and easy to implement. It enables to achieve a phase resolution of 5nm. In this paper, we will describe the QWLSI system and apply it to metasurface shape and laser-induced refractive index variation measurements like waveguides and LIDT.

Conference Presentation

Citation Download Citation

Antoine Federici, Sherazade Aknoun, William Boucher, and Benoit Wattellier "High-resolution single-shot refractive index variation measurement using quadriwave lateral shearing interferometry (Conference Presentation)", Proc. SPIE 11290, High Contrast Metastructures IX, 112901J (10 March 2020); https://doi.org/10.1117/12.2544303

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