Presentation + Paper
23 March 2020 Rigorous vase data fitting for ultrathin films
Zhimin Zhu Sr., Joyce Lowes, Shawn Ye, Zhiqiang Fan, Darin Collins, James Lamb, Tim Limmer
Author Affiliations +
Abstract
Measuring properties of ultrathin optical films is based on optical interference. Ultrathin films are very challenging to test, because their thicknesses are far smaller than the measuring wavelength, so very little phase shift can be detected. In this work, test sensitivity and accuracy are improved by a rigorous algorithm in which all unknowns {n,k,t} in their full space are fit together without approximations and presumptions. As a result, a software for variable-angle spectroscopic ellipsometer (VASE) data fitting was developed. It gives very reliable ultrathin-film measurement down to 2.5 nanometers. The software not only improves the reliability, accuracy of {n,k,t} measurement, but it also extends VASE capabilities to characterize a film’s optical quality.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhimin Zhu Sr., Joyce Lowes, Shawn Ye, Zhiqiang Fan, Darin Collins, James Lamb, and Tim Limmer "Rigorous vase data fitting for ultrathin films", Proc. SPIE 11327, Optical Microlithography XXXIII, 113270J (23 March 2020); https://doi.org/10.1117/12.2551934
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KEYWORDS
Algorithm development

Semiconducting wafers

Polymer thin films

Polymers

Software development

Optics manufacturing

Scattering

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