Presentation + Paper
22 August 2020 Detection and identification of plastics using SWIR hyperspectral imaging
Mehrube Mehrubeoglu, Austin Van Sickle, Jeffrey Turner
Author Affiliations +
Abstract
Most plastics are typically transparent in the visible spectral range, rendering them challenging to detect using silicon-based vision sensors. In this work a SWIR hyperspectral imaging system is used to collect the SWIR hyperspectral signatures as well as spatial information of a variety of plastics outdoors to test this technology for plastic debris detection and identification in future marine and environmental applications. In this study, hyperspectral imaging data have been collected from plastic samples including CPVC, PVC, LDPE, HDPE, PEEK PETG, PC, PP, PS, and Polyester in a natural environment. The data is acquired using a SWIR hyperspectral imaging system sensitive to 900 - 1700 nm wavelength range. Four spectral indices based on labeled spectral signatures have been identified and used as features to separate plastic materials and for classification of pixels. Semantic segmentation based on plastic materials is achieved in an independent scene with multiple plastic samples using shortest Euclidean distance to labeled feature cluster centers through multi-variate data analysis. The results show the capability of this technology and technique to detect and classify different plastics in natural environments under different light conditions.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mehrube Mehrubeoglu, Austin Van Sickle, and Jeffrey Turner "Detection and identification of plastics using SWIR hyperspectral imaging", Proc. SPIE 11504, Imaging Spectrometry XXIV: Applications, Sensors, and Processing, 115040G (22 August 2020); https://doi.org/10.1117/12.2570040
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Hyperspectral imaging

Short wave infrared radiation

Calibration

Reflectivity

Classification systems

Image segmentation

Statistical analysis

Back to Top