Presentation
5 March 2021 Atomic-scale modeling of interface roughness scattering in quantum cascade lasers
Author Affiliations +
Abstract
The theory of interface roughness scattering is well established in the case of idealized abrupt interfaces. Here we generalize this theory for finite interfacial widths. Experimental findings for Ge/GeSi interfaces show that the interface roughness can be correlated along the growth directions at length scales smaller than the interfacial width. This feature is included in a generalized theory of interface roughness scattering, accounting for correlations along both in-plane and out-of-plane directions. This model is included in a nonequilibrium Green’s functions simulator, allowing to assess the impact of interface roughness on the performances of quantum cascade lasers.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thomas Grange, Samik Mukherjee, Giovanni Capellini, Michele Montanari, Luca Persichetti, Luciana Di Gaspare, Stefan Birner, Anis Attiaoui, Oussama Moutanabbir, Michele Virgilio, and Monica De Seta "Atomic-scale modeling of interface roughness scattering in quantum cascade lasers", Proc. SPIE 11705, Novel In-Plane Semiconductor Lasers XX, 117050X (5 March 2021); https://doi.org/10.1117/12.2585205
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KEYWORDS
Laser scattering

Scattering

Quantum cascade lasers

Optical simulations

Performance modeling

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