PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Shih-Ping Chang
"Advanced measurement method for PIPBODAF film thickness of Fan out package", Proc. SPIE 11782, Optical Measurement Systems for Industrial Inspection XII, 117821O (20 June 2021); https://doi.org/10.1117/12.2598980
ACCESS THE FULL ARTICLE
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Shih-Ping Chang, "Advanced measurement method for PIPBODAF film thickness of Fan out package," Proc. SPIE 11782, Optical Measurement Systems for Industrial Inspection XII, 117821O (20 June 2021); https://doi.org/10.1117/12.2598980