Electro-optical measuring system for investigating the reflection-supressing properties of novel nanosurfaces

Malte Nickel; Ubbo Ricklefs; Jochen Frey

doi:10.1117/12.2592406

20 June 2021 Electro-optical measuring system for investigating the reflection-supressing properties of novel nanosurfaces

Malte Nickel, Ubbo Ricklefs, Jochen Frey

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Proceedings Volume 11782, Optical Measurement Systems for Industrial Inspection XII; 117821T (2021) https://doi.org/10.1117/12.2592406
Event: SPIE Optical Metrology, 2021, Online Only

Conference Poster

Abstract

Nano surfaces offer exciting opportunities to implement novel technologies. With their help, surfaces can be created that are very suitable as a reflection-absorbing layer. In order to be able to determine the degree of reflection and to compare it with the current methods of anti-reflection coating, a measuring system was developed which can measure the degree of reflection hemispherically. Furthermore, a simulation model was developed with which the behavior of the nano-surfaces can be examined with different parameters.

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Malte Nickel, Ubbo Ricklefs, and Jochen Frey "Electro-optical measuring system for investigating the reflection-supressing properties of novel nanosurfaces", Proc. SPIE 11782, Optical Measurement Systems for Industrial Inspection XII, 117821T (20 June 2021); https://doi.org/10.1117/12.2592406

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