Advances in detector-integrated filter coatings for the far ultraviolet

John Hennessy; April D. Jewell; Michael E. Hoenk; Shouleh Nikzad

doi:10.1117/12.2595524

24 August 2021 Advances in detector-integrated filter coatings for the far ultraviolet

John Hennessy, April D. Jewell, Michael E. Hoenk, Shouleh Nikzad

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Proceedings Volume 11821, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XXII; 118211A (2021) https://doi.org/10.1117/12.2595524
Event: SPIE Optical Engineering + Applications, 2021, San Diego, California, United States

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Abstract

We report on the continued development of multilayer optical coatings on back-illuminated silicon imaging sensors in order to enhance the functionality of such systems at ultraviolet wavelengths. This includes the development metal-dielectric filter structures to enable solar-blind operation, and graded thickness coatings to tune the spatial response of a detector system to the dispersion of a spectrometer. Such systems can maintain the high internal quantum efficiency afforded by the delta-doping process utilized at NASA JPL, while also providing long-wavelength rejection or a spatially optimized efficiency (or both). We present the characterization of CCD and CMOS image sensors incorporating these processes, and describe the atomic layer deposition coating processes. Such detectors are currently being developed for ground-based high energy physics applications as well as NASA orbital astrophysics instruments operating at wavelengths shorter than 200 nm.

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John Hennessy, April D. Jewell, Michael E. Hoenk, and Shouleh Nikzad "Advances in detector-integrated filter coatings for the far ultraviolet", Proc. SPIE 11821, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XXII, 118211A (24 August 2021); https://doi.org/10.1117/12.2595524

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