Presentation + Paper
12 October 2021 File formats for curvilinear multi-beam writing of 193i and EUV masks
Christof Zillner, Amir Moqanaki, Harald Höller, Elmar Platzgummer, Masakazu Hamaji, Taigo Fujii
Author Affiliations +
Abstract
The semiconductor industry's migration to EUV for the leading-edge nodes provides significant advantages and poses new challenges for the mask writers. The mask quality requirements for the leading-edge process technology call for ILT (Inverse Lithography Technology) and curvilinear patterns to improve the attainable resolution on wafers and extend the process windows. While single-beam writers cannot handle writing arbitrary curvilinear patterns without throughput penalty, multi-beam mask writers (MBMW) can easily print such patterns without degrading their throughput5,6. However, the transition to the curvilinear mask ILT significantly increases the layout complexity, posing a challenge for data transfer and storage systems as the file sizes increase substantially1. Traditionally, multi-beam-writers have been using a mask data input format derived from OASIS P44, namely OASIS.MBW 1.0/1.2, leading to multi-terabyte layouts. We present OASIS.MBW 2.1 as an efficient data format for curvilinear ILT masks. OASIS.MBW 2.1 enables a dramatic reduction in file size and vertex-density and preserves the qualities of OASIS.MBW 1.1/1.2 as well as quick and easy adaptability for the end-users. This is achieved by allowing the use of the OASIS P39 POLYGON RECORD in addition to the other OASIS.MBW 1.x properties, creating a hybrid format between OASIS P39 and P44 that provides a minimal file size comparable to OASIS P39 for pre- and post-fracture data operations at the fabs. Consequently, OASIS.MBW 2.1 provides the optimal combination of minimized file size and minimized required CPU time, thus enabling fast processing as well as a fast transfer for all applications.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christof Zillner, Amir Moqanaki, Harald Höller, Elmar Platzgummer, Masakazu Hamaji, and Taigo Fujii "File formats for curvilinear multi-beam writing of 193i and EUV masks", Proc. SPIE 11855, Photomask Technology 2021, 1185512 (12 October 2021); https://doi.org/10.1117/12.2602375
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KEYWORDS
Photomasks

Extreme ultraviolet

Data conversion

Data processing

Information technology

Data storage

Data corrections

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