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The demand for large coated flat and curved optics is growing for applications in automotive (windshields, LIDAR windows) or space (spectrally resolved imaging, FSO Lasercom). Their large size leading to high Transmitted wavefront error (TWE) and their sensitivity to wavelength require new metrology instruments. We propose measuring the TWE of such optics with a quadriwave lateral shearing interferometer (QLSI) based wave front sensor, in a double-pass configuration. We present the instrument ability to measure optics in their full transmission spectral band. We also discuss the best strategy to characterize large TWE optics in dynamic ranges exceeding tens of microns.
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Aurélie Bétourné, Quentin Lorphelin, Marion Oudin, Bertille Ghesquière, Adrien Pallares, Valentin Genuer, Benoit Wattellier, "Polychromatic and high dynamic range measurement of flat optics using a quadriwave lateral shearing wave-front sensor," Proc. SPIE 11889, Optifab 2021, 1188906 (28 October 2021); https://doi.org/10.1117/12.2602534