High chief ray angle and high numerical aperture optics characterization using a quadriwave lateral shearing interferometer (QLSI)

Charankumar Godavarthi; Marion Oudin; Alexandre Detruit; Adrien Pallares; Antoine Gascon; Valentin Genuer; Benoit Wattellier

doi:10.1117/12.2601679

28 October 2021 High chief ray angle and high numerical aperture optics characterization using a quadriwave lateral shearing interferometer (QLSI)

Charankumar Godavarthi, Marion Oudin, Alexandre Detruit, Adrien Pallares, Antoine Gascon, Valentin Genuer, Benoit Wattellier

Author Affiliations +

Proceedings Volume 11889, Optifab 2021; 118890G (2021) https://doi.org/10.1117/12.2601679
Event: SPIE Optifab, 2021, Rochester, New York, United States

Abstract

Smartphones, AR/VR and ADAS optics are challenging to qualify due to their short focal length, high chief ray angle and numerical aperture. Wave front sensing measures the optical aberration and the associated Zernike coefficients, which are used to understand manufacturing errors. In this paper, we propose to use a quadriwave lateral shearing wave front sensor, which is able to characterize such samples without any intermediate optics. This configuration makes the qualification process comprehensive and fast. We will present examples of commercial and calibrated optics with CRA larger than 35°.

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Charankumar Godavarthi, Marion Oudin, Alexandre Detruit, Adrien Pallares, Antoine Gascon, Valentin Genuer, and Benoit Wattellier "High chief ray angle and high numerical aperture optics characterization using a quadriwave lateral shearing interferometer (QLSI)", Proc. SPIE 11889, Optifab 2021, 118890G (28 October 2021); https://doi.org/10.1117/12.2601679

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