Paper
28 October 2021 Measurement of woods complex permittivity in 220-325 GHz band
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Abstract
In this paper, the S-parameters of 2mm silicon wafer, 14.345mm wood I, 14.215mm wood II and 13.80mm wood III were measured based on 220-325 GHz quasi optical Vector Network Analyzer measurement system. Basic theory based on free space electromagnetic component equations, boundary conditions and S parameters. The electromagnetic field of "air-MUT-air" three-layer structure between calibrated reference planes is analyzed in detail, and the formula of complex permittivity is derived. The results of complex permittivity of silicon wafer extracted by this method are basically consistent with those in the literature. The measurement of woods can accurately distinguish heartwood from sapwood. This study is helpful for us to better understand the interaction mechanism between terahertz waves and wood media, and can lay a foundation for the identification of woods.
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ji Cao, Rui Jia, Jing Xu, Zhenwei Zhang, and Cunlin Zhang "Measurement of woods complex permittivity in 220-325 GHz band", Proc. SPIE 11906, Infrared, Millimeter-Wave, and Terahertz Technologies VIII, 119061K (28 October 2021); https://doi.org/10.1117/12.2604057
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KEYWORDS
Silicon

Dielectrics

Semiconducting wafers

Free space

Terahertz radiation

Antennas

Electromagnetism

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