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15 September 2021 Horizontal drift correction by trajectory of sinogram centroid fitting for laboratory x-ray nanotomography
Mengnan Liu, Yu Han, Xiaoqi Xi, Mingwan Zhu, Linlin Zhu, Xiaofu Song, Guanyu Kang, Shuangzhan Yang, Lei Li, Bin Yan
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Proceedings Volume 11915, International Conference on Optics and Image Processing (ICOIP 2021); 119150M (2021) https://doi.org/10.1117/12.2605873
Event: International Conference on Optics and Image Processing (ICOIP 2021), 2021, Guilin, China
Abstract
X-ray nanotomography has become an important analysis tool in a wide range of fields. However, the imaging quality is often affected by drift from focal spot movement and mechanical instability. An improved horizontal drift correction method for X-ray nanotomography based on trajectory of sinogram centroid (TSC) is proposed. This method requires neither auxiliary marks nor additional projections. A sliding window TSC fitting method is utilized. The sum of the squared errors (SSE) is calculated between the trajectory and standard sinusoidal curve. The one corresponding to the minimum SSE is chosen to obtain the horizontal drift from the original TSC, which is then used to align the projections. The proposed method is evaluated by both simulation results of the Shepp-Logan phantom and nanotomographic results of the honeybee mouthpart. The results show that this method can quickly and effectively correct the projection horizontal drift.
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Mengnan Liu, Yu Han, Xiaoqi Xi, Mingwan Zhu, Linlin Zhu, Xiaofu Song, Guanyu Kang, Shuangzhan Yang, Lei Li, and Bin Yan "Horizontal drift correction by trajectory of sinogram centroid fitting for laboratory x-ray nanotomography", Proc. SPIE 11915, International Conference on Optics and Image Processing (ICOIP 2021), 119150M (15 September 2021); https://doi.org/10.1117/12.2605873
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KEYWORDS
X-rays
Sensors
Image quality
Image resolution
Reconstruction algorithms
Tomography
X-ray imaging
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