Spin-hall effect of light at near-normal incidence due to reflection at a plane dielectric interface

Nitish Kumar; Upasana Baishya; Nirmal K. Viswanathan

doi:10.1117/12.2608245

2 March 2022 Spin-hall effect of light at near-normal incidence due to reflection at a plane dielectric interface

Nitish Kumar, Upasana Baishya, Nirmal K. Viswanathan

Proceedings Volume 12017, Complex Light and Optical Forces XVI; 120170A (2022) https://doi.org/10.1117/12.2608245
Event: SPIE OPTO, 2022, San Francisco, California, United States

Abstract

Understanding the spin-Hall effect of light (SHEL) and in general the spin-shifts (SS) both in the plane of incidence and perpendicular to it are of fundamental and applied research interest. The small polarization changes and hence the beam shifts arising due to light-matter interaction are optically amplified and measured via the weak measurement method. We report here simulation results for the appearance of SS at near-normal (NN) incidence due to focused TM-polarized Gaussian beam reflected at a plane dielectric interface. Measured at the Fourier plane, the cross-polarization component in the output beam shows significant SS due to changes in the state of polarization. The proposed NN incidence configuration has significant experimental advantages as compared to the conventional SHEL / SS measurements and could be used to measure physical parameters and changes in them.

Conference Presentation

Citation Download Citation

Nitish Kumar, Upasana Baishya, and Nirmal K. Viswanathan "Spin-hall effect of light at near-normal incidence due to reflection at a plane dielectric interface", Proc. SPIE 12017, Complex Light and Optical Forces XVI, 120170A (2 March 2022); https://doi.org/10.1117/12.2608245

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