Paper
16 February 2022 Stress-induced deformation of sandstone monitored in x-ray microscopy and its influence on permeability evolution
Yifei Zhang, Yong Yang, Shaoxian Bing, Zhigang Sun, Qiang Sun
Author Affiliations +
Proceedings Volume 12164, International Conference on Optoelectronic Materials and Devices (ICOMD 2021); 121640L (2022) https://doi.org/10.1117/12.2628471
Event: 2021 International Conference on Optoelectronic Materials and Devices, 2021, Guangzhou, China
Abstract
In recent years, various digital cores have been constructed to depict the microstructure of rock. However, how to reveal the evolution of microstructure and fluid flow in the process of mechanical damage is a big challenge. In this paper, based on in-situ uniaxial compression in three-dimensional (3D) X-ray microscopy, the Es3 sandstone was used to study the stress-induced structure deformation and its influence on permeability at pore scale. Both two-dimensional (2D) images and 3D digital cores were reconstructed at different stress stages. During the progressive deformation process of rock, porosity, effective porosity, pore size distribution, pore shape distribution, tortuosity and fractal dimension were obtained. Based on digital cores, the permeability was calculated and seepage path was simulated under different axial stresses. This work revealed that the distribution of pores and effective pores in sandstone is microscopically heterogeneous. In compaction stage, the pores shrank and micro cracks closed, consequently the permeability decreased. In fracturing process, the pores expanded and new cracks were generated, as a result, the permeability significantly increased.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yifei Zhang, Yong Yang, Shaoxian Bing, Zhigang Sun, and Qiang Sun "Stress-induced deformation of sandstone monitored in x-ray microscopy and its influence on permeability evolution", Proc. SPIE 12164, International Conference on Optoelectronic Materials and Devices (ICOMD 2021), 121640L (16 February 2022); https://doi.org/10.1117/12.2628471
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KEYWORDS
Microfluidics

3D modeling

3D image processing

Fractal analysis

X-ray microscopy

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