Design of high-speed channel switching system

Yong Hu; Qian Liu; Quoxiong Wang

doi:10.1117/12.2629111

7 March 2022 Design of high-speed channel switching system

Yong Hu, Qian Liu, Quoxiong Wang

Proceedings Volume 12167, Third International Conference on Electronics and Communication; Network and Computer Technology (ECNCT 2021); 121671C (2022) https://doi.org/10.1117/12.2629111
Event: 2021 Third International Conference on Electronics and Communication, Network and Computer Technology, 2021, Harbin, China

Abstract

The calibration of Automated Test Equipment(ATE) is an important part of microelectronics measurement. To achieve full calibration of high-speed ATE, each high-speed digital channel should be traced to the calibration equipment. This paper provides a design of high-speed signal switching system, which can effectively reduce or even eliminate the impact of path impedance discontinuity caused by the change of switching impedance, protect the safety of equipment and the stability of the signal to be measured, and effectively reduce the wave reflection effect caused by the change of impedance at the moment of channel switching.

Citation Download Citation

Yong Hu, Qian Liu, and Quoxiong Wang "Design of high-speed channel switching system", Proc. SPIE 12167, Third International Conference on Electronics and Communication; Network and Computer Technology (ECNCT 2021), 121671C (7 March 2022); https://doi.org/10.1117/12.2629111

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