Paper
6 May 2022 Deep learning-based object detection algorithm for mask surface defects
Yuanzhang Zhao, Shengling Geng II
Author Affiliations +
Proceedings Volume 12256, International Conference on Electronic Information Engineering, Big Data, and Computer Technology (EIBDCT 2022); 122561R (2022) https://doi.org/10.1117/12.2635390
Event: 2022 International Conference on Electronic Information Engineering, Big Data and Computer Technology, 2022, Sanya, China
Abstract
In order to solve the problem of product defects in the mask production process. In this paper, an algorithm for target detection of mask surface defects based on YOLOv5 is proposed. The industrial-like camera and industrial-like light source are used to collect the data set, and the data set is filtered and manually labeled. The extracted features of mask defects, broken ear straps, and solder joints are trained and tested using the YOLOv5 algorithm. The experiments show that the YOLOv5 algorithm can effectively identify various defects on the mask surface, improve mask production quality and reduce mask production cost.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuanzhang Zhao and Shengling Geng II "Deep learning-based object detection algorithm for mask surface defects", Proc. SPIE 12256, International Conference on Electronic Information Engineering, Big Data, and Computer Technology (EIBDCT 2022), 122561R (6 May 2022); https://doi.org/10.1117/12.2635390
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Target detection

Detection and tracking algorithms

Data modeling

Defect detection

Network architectures

Image scaling

Light sources

RELATED CONTENT


Back to Top