Influence of different environmental aging tests on image quality attenuation of optical imaging system

T. T. Wang; Yi Xu; Quan Zhou

doi:10.1117/12.2660565

31 October 2022 Influence of different environmental aging tests on image quality attenuation of optical imaging system

T. T. Wang, Yi Xu, Quan Zhou

Proceedings Volume 12457, Second International Conference on Testing Technology and Automation Engineering (TTAE 2022); 124571R (2022) https://doi.org/10.1117/12.2660565
Event: Second International Conference on Testing Technology and Automation Engineering (TTAE 2022), 2022, Changchun, China

Abstract

Optical imaging systems are widely used in various video surveillance sites, which may endure various harsh environmental aging conditions such as salt mist, change of temperature. However, there are few studies on the impact of various environmental tests on the overall imaging performance of the system. In this paper, several common environmental tests are selected to analyze their quantitative impact on the imaging quality of typical imaging systems. The imaging resolution, color revent and gray scale value are selected as the main imaging parameters. The study found that the salt mist test, gas corrosion, damp heat test, high and low temperature shock, and ultraviolet test have a great impact on the optical imaging system. Long-term exposure will cause the imaging quality of the imaging system to decrease significantly, with typical parameters attenuated by more than 10%. High temperature test, low temperature test, vibration test, waterproof test, low air pressure, shock and dust test have little effect on its image quality, the system has good tolerance to it, and the typical parameter attenuation is below 5%. This paper will provide some reference for the rational use of optical imaging systems and the compilation of test standards.

Citation Download Citation

T. T. Wang, Yi Xu, and Quan Zhou "Influence of different environmental aging tests on image quality attenuation of optical imaging system", Proc. SPIE 12457, Second International Conference on Testing Technology and Automation Engineering (TTAE 2022), 124571R (31 October 2022); https://doi.org/10.1117/12.2660565

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