A novel technique using a W-band metasurface for the purpose of transmissive fine powder layer sensing is presented. The proposed technique may allow for the detection, identification, and characterization of inhomogeneous ultrafine powder layers which are effectively hundreds of times thinner than the incident wavelengths used to sense them. Such a technique may be useful during personnel screening processes (i.e., at an airport) and in industrial manufacturing environments where early detection and quantization of harmful airborne particulates can be a matter of security or safety. Recently, characterizations of ultrathin powder layers using a novel metasurface sensing technique have been conducted at W-band1. Finally, a novel technique utilizing this metasurface will be presented, which could aid in the characterization of various dilute dielectric materials in solutions.
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