Presentation + Paper
13 June 2023 SAMPLE with a side of MSTAR: extending SAMPLE with outliers and target variants from MSTAR
Author Affiliations +
Abstract
Deep learning is a technology applied to a host of problems in the decade since its introduction. Of particular interest for both defense and civil applications is the technology of automatic target recognition, which is a subset of visual detection and classification. However, these classification algorithms must be robust to out-of-library confusers and able to generalize across a variety of target types. In this paper, we augment the existing Synthetic and Measured Paired Labeled Experiment dataset of synthetic aperture radar images with the remainder of the public MSTAR dataset and define a set of experiments to encourage the development of traits beyond simple classification accuracy for target recognition algorithms.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Benjamin Lewis, Mark Ashby, and Edmund Zelnio "SAMPLE with a side of MSTAR: extending SAMPLE with outliers and target variants from MSTAR", Proc. SPIE 12520, Algorithms for Synthetic Aperture Radar Imagery XXX, 1252007 (13 June 2023); https://doi.org/10.1117/12.2661101
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KEYWORDS
Calibration

Clutter

Detection and tracking algorithms

Machine learning

Synthetic aperture radar

Target recognition

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