Paper
27 February 2023 Experimental study on damage location based on electrical importance tomography technology
Author Affiliations +
Proceedings Volume 12585, International Conference on Precision Instruments and Optical Engineering (PIOE 2022); 125851H (2023) https://doi.org/10.1117/12.2667858
Event: International Conference on Precision Instruments and Optical Engineering (PIOE 2022), 2022, Guangzhou, China
Abstract
Electrical importance tomography (EIT) is a non-invasive technique that aims at reconstructing the internal tissue image of the human body. In this paper, the application of EIT technology in pressure equipment flaw detection is experimentally studied. This paper mainly studies the feasibility of applying EIT technology to temperature monitoring and location, pressure damage location and surface crack defect location. The results show that this method can better detect and locate damage.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Facai Ren "Experimental study on damage location based on electrical importance tomography technology", Proc. SPIE 12585, International Conference on Precision Instruments and Optical Engineering (PIOE 2022), 125851H (27 February 2023); https://doi.org/10.1117/12.2667858
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KEYWORDS
Technology

Sensors

Carbon fibers

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