Paper
4 April 2023 Accurate measurement, decomposition, and depolarization calculation for Mueller Matrices of mixed samples
Hongzhe Li, Zhimin Zhao, Delong Meng, Lin Li, Dongliang Zheng, Weixian Qian, Kan Ren, Chao Zuo
Author Affiliations +
Proceedings Volume 12617, Ninth Symposium on Novel Photoelectronic Detection Technology and Applications; 126177B (2023) https://doi.org/10.1117/12.2666819
Event: 9th Symposium on Novel Photoelectronic Detection Technology and Applications (NDTA 2022), 2022, Hefei, China
Abstract
Recently, Mueller matrix polarimetry has been widely used in a number of aspects, such as biomedicine, remote sensing, target decomposition, etc. However, it is still challenging for the measurement, decomposition, and depolarization resulting from complex light-matter interactions of mixed samples. In this work, the Mueller matrix measurement and decomposition methods are proposed for the mixed sample with rough surfaces. First, the linear combination of the two different Mueller matrices resulting in depolarization is proved. Second, the optimal method is used to decompose and correct the Mueller matrices of the sample. Finally, the accurate depolarization of the mixed sample is obtained by using the eigenvalue method. The experiment results validate that the method has great potential in the accurate measurement, noise reduction, and decomposition of Mueller matrices of mixed samples with rough surfaces.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hongzhe Li, Zhimin Zhao, Delong Meng, Lin Li, Dongliang Zheng, Weixian Qian, Kan Ren, and Chao Zuo "Accurate measurement, decomposition, and depolarization calculation for Mueller Matrices of mixed samples", Proc. SPIE 12617, Ninth Symposium on Novel Photoelectronic Detection Technology and Applications, 126177B (4 April 2023); https://doi.org/10.1117/12.2666819
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KEYWORDS
Depolarization

Mueller matrices

Polarization

Scattering

Superposition

Matrices

Polarimetry

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