Paper
1 August 1990 PLISD: a new high-vacuum sputtering technique for thin film deposition
Liang Shi
Author Affiliations +
Proceedings Volume 1270, Optical Thin Films and Applications; (1990) https://doi.org/10.1117/12.20376
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands
Abstract
A new sputtering technique (PLISD: Pulsed-Laser Induced Sputtering Deposition) for thin film deposition is reported. Instead of the glow discharges of usual sputtering processes, PLISD uses a pulsed laser and an electrically conductive target for the generation of the bombarding ions. Its features and possible advantages are indicated, among which is the possibility to carry out sputtering deposition in a high-vacuum environment. Some preliminary experimental results are given which demonstrate the feasibility of the PLISD technique.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Liang Shi "PLISD: a new high-vacuum sputtering technique for thin film deposition", Proc. SPIE 1270, Optical Thin Films and Applications, (1 August 1990); https://doi.org/10.1117/12.20376
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KEYWORDS
Sputter deposition

Ions

Pulsed laser operation

Power supplies

Copper

Thin films

Thin film deposition

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