Presentation + Paper
12 March 2024 High-speed heat accumulation temperature measurement in high-throughput laser surface texturing for advanced coating substrate preparation
Author Affiliations +
Abstract
Laser material micro-processing with high repetition frequencies of laser pulses is able to initiate heat accumulation effects that can decrease processing rate and quality. In order to gain deeper insights into these effects, a temperature measurement system with nanosecond time resolution was developed using infrared detector and a set of parabolic mirrors. For measurement in more industrially relevant processes on larger areas, alternative configurations were developed: measurement through the scan head and multifocus ellipsoidal mirror. This work is initially focused on comparison of advantages and limitations of the developed measurement configurations by signal to noise ratio, field of view and measurable temperature range. The measurement systems were then used for the analysis of polygon scanner based high-speed laser surface texturing of steel and ceramics substrates as a preparation method for thermal spraying of coatings. GHz burst femtosecond laser ablation was analyzed and long-time process monitoring using FPGA hardware analysis was developed and performed for the laser texturing process.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Jiri Martan, Denys Moskal, Carlos Beltrami, Milan Honner, Inigo Ramon Conde, Sebastian Kraft, Joerg Schille, Vladislav Lang, Sarka Houdkova, Jiri Matejicek, Eric Audouard, Jiri Skala, and Udo Loeschner "High-speed heat accumulation temperature measurement in high-throughput laser surface texturing for advanced coating substrate preparation", Proc. SPIE 12873, Laser-based Micro- and Nanoprocessing XVIII, 1287308 (12 March 2024); https://doi.org/10.1117/12.3000621
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Laser ablation

Laser processing

Parabolic mirrors

Temperature metrology

Coating

Field programmable gate arrays

Signal processing

Back to Top