Nanoscale fractal analysis of watermarked paper surface topography studied by atomic force microscopy

Tetiana Kyrychok; Tetiana Klymenko; Bohdan Bardovskyi

doi:10.1117/12.3012694

5 January 2024 Nanoscale fractal analysis of watermarked paper surface topography studied by atomic force microscopy

Tetiana Kyrychok, Tetiana Klymenko, Bohdan Bardovskyi

Proceedings Volume 12938, Sixteenth International Conference on Correlation Optics; 1293815 (2024) https://doi.org/10.1117/12.3012694
Event: International Conference Correlation Optics (COR 2023), 2023, Chernivtsi, Ukraine

Abstract

Fractal geometry with its ability of description difficult and irregular models found application in different scientific disciplines. In a field of production and polygraphic production protection understanding properties of paper with watermarks has crucial role in authentication and quality assurance. Fractal analysis gives powerful instrument for quantity description of difficult templates, which are created with watermarks on paper substrates, what gives ability to get vital information about its difficulty and uniqueness. This article is a complex research, which focuses on calculation of fractal dimension of paper surfaces with watermarks with the help of advanced methods of displaying and computational analysis. In the result we have interdependencies of fractal dimensions between measurements with different level of distance.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Tetiana Kyrychok, Tetiana Klymenko, and Bohdan Bardovskyi "Nanoscale fractal analysis of watermarked paper surface topography studied by atomic force microscopy", Proc. SPIE 12938, Sixteenth International Conference on Correlation Optics, 1293815 (5 January 2024); https://doi.org/10.1117/12.3012694

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