PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Based on our simulations, we have developed a systematic approach to identifying suitable materials for short-period multilayer mirrors operating at 30 keV. We tested many materials and evaluated the performance of each possible combination, focusing on two key figures of merit: integrated reflectivity and peak reflectivity. While it is typical to optimize a multilayer structure to maximize the peak reflectance, we found that this approach can lead to bias. Instead, we propose using integrated reflectivity as a more robust criterion for material selection. Our results demonstrate the effectiveness of this approach in identifying high-performance multilayer mirrors for x-ray applications.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Corentin Nannini,Nolann Ravinet,Antoine Lejars,Evgueni Meltchakov, andFranck Delmotte
"Selecting materials for short-period multilayer x-ray mirrors: comparison between peak and integrated reflectivity", Proc. SPIE 13020, Advances in Optical Thin Films VIII, 130200X (24 June 2024); https://doi.org/10.1117/12.3016698
ACCESS THE FULL ARTICLE
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Corentin Nannini, Nolann Ravinet, Antoine Lejars, Evgueni Meltchakov, Franck Delmotte, "Selecting materials for short-period multilayer x-ray mirrors: comparison between peak and integrated reflectivity," Proc. SPIE 13020, Advances in Optical Thin Films VIII, 130200X (24 June 2024); https://doi.org/10.1117/12.3016698