Principal Component Analysis (PCA) is commonly used for dimensionality reduction, feature extraction, data denoising, and visualization. The L1-PCA is known to confer robustness or a resistance to outliers in the data. In this paper, a new method for L1-PCA is explored using quantum annealing hardware. To showcase performance increases as compared to other PCA types, results for a fault detection scenario are presented and the speedup of L1-PCA using quantum annealing is demonstrated. Additionally, L1-PCA has better fault detection rates than L2-PCA when in the presence of outliers.
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