Test system for phase-change optical disks

Shuji Urabe; Akira Ohya; Kenta Mikuriya; Masato Yamomoto

doi:10.1117/12.22037

1 August 1990 Test system for phase-change optical disks

Shuji Urabe, Akira Ohya, Kenta Mikuriya, Masato Yamomoto

Proceedings Volume 1316, Optical Data Storage; (1990) https://doi.org/10.1117/12.22037
Event: Optical Data Storage, 1990, Vancouver, Canada

Abstract

We have developed a test system for phase-change optical disks. The test system has a two-beam head, which can vary the distance between the two laser spots from -0.3 to 2.8 μm. Erasing characteristics can be evaluated by changing the intensity profile of the erasing spot composed of two laser spots. Focusing the two spots on the same position allows high laser power writing up to 27mW. Reflectance change after the irradiation by one spot can be observed by another spot on rotating disks. This test system can evaluate the single beam overwriting characteristics.

Citation Download Citation

Shuji Urabe, Akira Ohya, Kenta Mikuriya, and Masato Yamomoto "Test system for phase-change optical disks", Proc. SPIE 1316, Optical Data Storage, (1 August 1990); https://doi.org/10.1117/12.22037

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