Poster + Paper
22 November 2024 Large-scale object 3D reconstruction based on trimmed ICP
Ruijie Ma, Rui Ma, Yiming Li, Xiang Qian, Yiqing Zou, Xinghui Li
Author Affiliations +
Conference Poster
Abstract
With the rapid development of industrial manufacturing, three-dimensional measurement technology has become an effective method to acquire three-dimensional information of industrial products and to conduct defect inspection. When dealing with large-scale target objects like triangular hole panels, it is essential to collect point cloud data from various angles multiple times and register them together to construct a complete three- dimensional model. Prior to registration, preprocessing steps such as denoising the single-frame point cloud data are crucial in enhancing the quality of the point clouds and registration performance. In this paper, a specialized three-dimensional mask for denoising is presented, and the point cloud registration process is divided into two stages: a new coarse registration workflow based on the Rodrigues’ formula and an improved Trimmed ICP algorithm for fine registration. The effects of varied degrees of overlap on the accuracy and speed of point cloud registration are explored to guide data collection. Additionally, contour registration is utilized instead of full point cloud registration to improve efficiency. The experimental results indicate that the process designed in this paper can achieve high-precision point cloud registration quickly with only 25% overlap between two frames, achieving a precision of less than 50μm, which meets the stringent requirements of industrial applications.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Ruijie Ma, Rui Ma, Yiming Li, Xiang Qian, Yiqing Zou, and Xinghui Li "Large-scale object 3D reconstruction based on trimmed ICP", Proc. SPIE 13238, Advanced Optical Imaging Technologies VII, 132380S (22 November 2024); https://doi.org/10.1117/12.3036385
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KEYWORDS
Point clouds

3D modeling

Matrices

Data modeling

3D mask effects

3D metrology

Tunable filters

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